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A physically-based model of the effective mobility in heavily-doped n-MOSFETs

✍ Scribed by Villa, S.; Lacaita, A.L.; Perron, L.M.; Bez, R.


Book ID
114537164
Publisher
IEEE
Year
1998
Tongue
English
Weight
178 KB
Volume
45
Category
Article
ISSN
0018-9383

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