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A nonpinchoff gradual channel model for deep-submicron MOSFET's

✍ Scribed by Fujishima, M.; Asada, K.

Book ID: 114535628
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 301 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.277352

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