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A new step in high-frequency EPR of defects in semiconductors

โœ Scribed by H. Blok; J.A.J.M. Disselhorst; S.B. Orlinskii; J. Schmidt; P.G. Baranov

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
298 KB
Volume
340-342
Category
Article
ISSN
0921-4526

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