𝔖 Bobbio Scriptorium
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A new SILO process for VLSI isolation using N2+ ion implantation

✍ Scribed by Duan Li; Li Weizhong; Wang Yong; Lin Yufeng


Book ID
103464993
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
355 KB
Volume
39
Category
Article
ISSN
0042-207X

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