𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A new preparation method for cross-sectional TEM specimens

✍ Scribed by Hans-Jaochim Klaar; Fu-Yung Hsu

Book ID
114341030
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
417 KB
Volume
36
Category
Article
ISSN
1044-5803

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Preparation of GaN-based cross-sectional
Preparation of GaN-based cross-sectional TEM specimens by laser lift-off
✍ Li Zilan; Hu Xiaodong; Chen Ke; Nie Ruijuan; Luo Xuhui; Zhang Xiaoping; Yu Tongj πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 246 KB

Laser lift-off (LLO) technology is successfully used to prepare GaN-based TEM cross-sectional specimens. Detailed procedures of the method to prepare the specimens are demonstrated. Large thin areas suitable for TEM analysis were obtained. TEM images of the resulting GaN interface are studied, and t

A procedure to prepare cross-sectional s
A procedure to prepare cross-sectional samples for TEM
✍ Rivaud, Lydia πŸ“‚ Article πŸ“… 1985 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 319 KB

Cross-sectional transmission electron microscopy (XTEM) is an imaging technique particularly suited to the study of layered structures. For integrated electronic devices it has become a common practice to use XTEM to assess the shape and crystallinity of component layers as well as defect structures