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A new method for reliability optimization : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. Microelectron. Reliab. 17, 605 (1978)

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 123 KB
Volume: 19
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(79)90199-9

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