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A new method for system reliability evaluation : K. K. Aggarwal, J. S. Gupta and K. B. Misra. Microelectron. & Reliab. 12, 435 (1973)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 110 KB
Volume: 13
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(74)90231-5

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