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A new method for system reliability evaluation : K. K. Aggarwal, J. S. Gupta and K. B. Misra. Microelectron. & Reliab.12, 435 (1972)

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 117 KB
Volume: 14
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(75)90343-1

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