Reliability analysis of multistate device networks : Krishna Gopal, K. K. Aggarwal and J. S. Gupta. IEEE Trans. Reliab.R-27, (3) 233 (August 1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 127 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90046-x