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A new method for pHEMT noise-parameter determination based on 50-Ω noise measurement system

✍ Scribed by Jianjun Gao; Choi Look Law; Hong Wang; Aditya, S.; Boeck, G.

Book ID: 114659873
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 701 KB
Volume: 51
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.2003.817680

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## Abstract A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise‐correlation matrix of an elemental section of the device from the device's noise figure, measured for only one source‐impedance state at a number of fre