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FET noise-parameter determination using a novel technique based on 50-Ω noise-figure measurements

✍ Scribed by Lazaro, A.; Pradell, L.; O'Callaghan, J.M.

Book ID
114553352
Publisher
IEEE
Year
1999
Tongue
English
Weight
364 KB
Volume
47
Category
Article
ISSN
0018-9480

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