Investigation of an InGaP/GaAs heterostr
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Shiou-Ying Cheng
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Article
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2001
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Elsevier Science
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English
β 297 KB
In this work, an improved InGaP/GaAs heterostructure-emitter bipolar transistor (HEBT) with an InGaP wide-bandgap collector is investigated. In the emitter-base region, the thin narrow bandgap n-type GaAs layer is sandwiched between a wide-bandgap N-type InGaP confinement layer and a narrow-bandgap