✦ LIBER ✦

A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement

✍ Scribed by D. Ang; C. Ling

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Study of hot-carrier degradation in subm

✍ D.S. Ang; C.H. Ling; Y.T. Yeow 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 322 KB

A study of hot carrier degradation in NM

✍ Ling, C.H.; Tan, S.E.; Ang, D.S. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 834 KB

A coupled study by floating-gate and cha

✍ Vuillaume, D.; Marchetaux, J.-C.; Lippens, P.-E.; Bravaix, A.; Boudou, A. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 946 KB

A new self-consistent model for the anal

✍ A. Valletta; L. Mariucci; A. Pecora; G. Fortunato; J.R. Ayres; S.D. Brotherton 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 177 KB