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A methodology to extract the channel current of permeable gate oxide MOSFETs

✍ Scribed by Palestri, P.; Esseni, D.; Selmi, L.; Guegan, G.; Sangiorgi, E.

Book ID: 114617093
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 611 KB
Volume: 50
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.813245

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