Sample preparation for VLSI analysis is often slow due to long ion milling time and because the location of the thin area of the sample is difficult to control. By modifying the standard techniques used with a VCR Group (and perhaps other) mechanical dimpler, the ion milling time can be reduced to l
✦ LIBER ✦
A method for preparing samples for electron microscope studies of materials unstable in air
✍ Scribed by V. I. Nikolaichik; M. N. Koval’chuk; M. A. Zaporozhets
- Book ID
- 111502388
- Publisher
- Allerton Press Inc
- Year
- 2011
- Tongue
- English
- Weight
- 433 KB
- Volume
- 75
- Category
- Article
- ISSN
- 1062-8738
No coin nor oath required. For personal study only.
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