Methods of onion seed preparation for scanning electron microscope studies of the seed coat
โ Scribed by Mohamed-Yasseen, Yasseen ;Jakstys, Birute P. ;Splittstoesser, Walter E.
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 1991
- Tongue
- English
- Weight
- 244 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0741-0581
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โฆ Synopsis
Scanning electron microscopy (SEM) has been used to study seed structure . Seeds with shrunken, cracked, or ruptured seed coats are usually short-lived . Seed shrinkage is an indication of a weak seed coat, resulting in cracks and damage which ultimately leads to loss of seed vigor or even death (Abdul-Baki and Anderson, 1970). This paper compares five different methods of seed preparation to observe shrinkage and cracks in onion seed coats.
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