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A measuring System for the Spectroscopy of the Low-Frequency Noise of Semiconductor Diode Structures

✍ Scribed by Kostryukov, S. A.; Ermachikhin, A. V.; Litvinov, V. G.; Kholomina, T. A.; Rybin, N. B.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Improved setup for studying the low-freq

✍ S. A. Sokolik; A. M. Gulyaev; I. N. Miroshnikova 📂 Article 📅 1997 🏛 Springer US 🌐 English ⚖ 362 KB

On the Noise of Semiconductor Diode Stru

✍ Gilenko, M. S. ;Karageorgy-Alkalaev, P. M. ;Leiderman, A. Yu. 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 211 KB

Determination of the parameters of deep

✍ T. A. Kholomina 📂 Article 📅 1998 🏛 Springer US 🌐 English ⚖ 395 KB

Apparatus for measuring the frequency ex

✍ V. F. Egorov; A. A. Kisurin; M. I. Shchevelev; A. N. Makovii 📂 Article 📅 1978 🏛 Springer US 🌐 English ⚖ 248 KB

Measuring arrangement for the low-freque

✍ L. P. Feshchenko; V. Z. Chernikov 📂 Article 📅 1976 🏛 Springer US 🌐 English ⚖ 242 KB

Low-frequency noise characteristics of P

✍ Eng, R. S. ;Mantz, A. W. ;Todd, T. R. 📂 Article 📅 1979 🏛 The Optical Society 🌐 English ⚖ 582 KB