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Improved setup for studying the low-frequency noise in semiconductor devices and structures

โœ Scribed by S. A. Sokolik; A. M. Gulyaev; I. N. Miroshnikova


Book ID
105602560
Publisher
Springer US
Year
1997
Tongue
English
Weight
362 KB
Volume
40
Category
Article
ISSN
0543-1972

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