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Measuring arrangement for the low-frequency noise characteristics of circuit components

โœ Scribed by L. P. Feshchenko; V. Z. Chernikov

Publisher
Springer US
Year
1976
Tongue
English
Weight
242 KB
Volume
19
Category
Article
ISSN
0543-1972

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## Abstract To investigate the reliability of ESD protection in smart power integrated circuits the ESD experiments are performed and degradation is analyzed by low frequency noise measurements. Combining the noise results with further failure analysis analytical methods we have examined a location