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Automatic system for measuring the characteristics of radio circuits at microwave frequencies

✍ Scribed by A. V. Gonikman; N. I. Gorlov; N. F. Dubkov; E. V. Krsheminskaya; A. V. Purtov

Publisher
Springer US
Year
1981
Tongue
English
Weight
332 KB
Volume
24
Category
Article
ISSN
0543-1972

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## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50Β°]. Original numerical me