✦ LIBER ✦
Low-frequency noise measurements as a complementary tool in the investigation of integrated circuit reliability
✍ Scribed by A. Diligenti; B. Neri; R. Saletti
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 424 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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