We describe a new high-brightness laser-plasma source for X-rays and extreme ultraviolet (EUV) radiation. By utilizing a liquid target the harmful emission of debris is significantly reduced or completely eliminated. The spectrum can be spectrally tailored by choosing a suitable liquid. We also show
A liquid-xenon-jet laser-plasma x-ray and EUV source
โ Scribed by B.A.M. Hansson; L. Rymell; M. Berglund; H.M. Hertz
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 275 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0167-9317
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โฆ Synopsis
We describe a laser-plasma soft-x-ray source based on a cryogenic-xenon liquid-jet target. The source is suitable for extreme ultraviolet (EUV) projection lithography and proximity x-ray lithography (PXL). Absolute calibrated spectra in the 1-2 nm range and uncalibrated spectra in the 9-15 nm range are obtained using a free-standing transmission grating and a CCD-detector.
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