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A knowledge-based test generator for standard cell and iterative array logic circuits

✍ Scribed by Varma, P.; Tohma, Y.

Book ID: 119773405
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 754 KB
Volume: 23
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.1003

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