✦ LIBER ✦

A high-resolution diffuse X-ray scattering study of defects in dislocation-free silicon crystals grown by the float-zone method and comparison with Czochralski-grown crystals

✍ Scribed by Lal, K. (author);Bhagavannarayana, G. (author)

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A high-resolution diffuse X-ray scatteri

✍ Lal, K. (author);Bhagavannarayana, G. (author) 📂 Article 📅 1989 🏛 International Union of Crystallography (IUCr) 🌐 English ⚖ 703 KB

Study of point defect clusters in high p

✍ R.R Ramanan; G Bhagavannarayana; Krishan Lal 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 436 KB

Theoretical and experimental study of th

✍ N. A. Verezub; A. I. Prostomolotov; M. V. Mezhennyi; M. G. Mil’vidskii; V. Ya. R 📂 Article 📅 2005 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 336 KB

X-ray diffraction study of the effect of

✍ V. A. Makara; N. N. Novikov; B. D. Patsai 📂 Article 📅 2005 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 85 KB