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Theoretical and experimental study of the formation of grown-in and as-grown microdefects in dislocation-free silicon single crystals grown by the Czochralski method

✍ Scribed by N. A. Verezub; A. I. Prostomolotov; M. V. Mezhennyi; M. G. Mil’vidskii; V. Ya. Reznik

Book ID
110144687
Publisher
SP MAIK Nauka/Interperiodica
Year
2005
Tongue
English
Weight
336 KB
Volume
50
Category
Article
ISSN
1063-7745

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