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A gel-based wafer-level testing procedure for microelectrodes

✍ Scribed by Maria Kindlundh; Peter Norlin

Book ID: 108263328
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 355 KB
Volume: 107
Category: Article
ISSN: 0925-4005
DOI: 10.1016/j.snb.2004.11.016

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