𝔖 Bobbio Scriptorium

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The isocurrent test: A promising tool for wafer-level evaluation of the interconnect reliability

✍ Scribed by A. Witvrouw; S. van Dooren; D. Wouters; M. van Dievel; K. Maex

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 282 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00212-0

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