✦ LIBER ✦
A cost-effective wafer-level reliability test system for integrated circuit makers
✍ Scribed by Summer Fan-Chung Tseng; Wei-Ting Kary Chien; Excimer Gong; Bing-Chu Cai
- Book ID
- 114629435
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 986 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9456
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