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A complementarity of the 1f noise and the charge-pumping methods for determination of the degradation of the small size MOS transistors

✍ Scribed by Franciszek Grabowski; Edward Stolarski

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 458 KB
Volume: 32
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(92)90464-v

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