๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A comparison of deterministic and statistical sampling techniques for quality analysis of integrated circuits

โœ Scribed by A. A. Ilumoka


Book ID
112184915
Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
803 KB
Volume
9
Category
Article
ISSN
0748-8017

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A new procedure for nonlinear statistica
โœ Francesco Centurelli; Alberto Di Martino; Giuseppe Scotti; Pasquale Tommasino; A ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 320 KB

A new statistical nonlinear model of GaAs FET MMICs which allows the representation of distance-dependent technological parameter variations by means of equivalent circuit parameters, and an automatic extraction procedure, are presented. The capability to reproduce statistical distribution has been