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A built-in-test scheme for evaluating the parameters of floating-gate MOS transistors

✍ Scribed by An Sang Hou


Book ID
114629900
Publisher
IEEE
Year
2005
Tongue
English
Weight
889 KB
Volume
54
Category
Article
ISSN
0018-9456

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Experimental data on ground- and excited
✍ AA Sonzogni πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 789 KB

Experimental data on ground-and excited-state properties for all nuclei with mass number A=144 have been compiled and evaluated. States populated in radioactive decay as well as in nuclear reactions have been considered. For these nuclei, level and decay schemes have been built, as well as tables of