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Method for evaluating the parameters of radiation defects and predicting the radiation resistance of MOS transistors

โœ Scribed by M. N. Levin; E. V. Bondarenko; A. E. Bormontov; A. V. Tatarintsev; V. R. Gitlin


Book ID
111450778
Publisher
SP MAIK Nauka/Interperiodica
Year
2010
Tongue
English
Weight
166 KB
Volume
36
Category
Article
ISSN
1063-7850

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