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Effects of space radiation damage and temperature on the noise in CCDs and LDD MOS transistors

✍ Scribed by Murowinski, R.G.; Linzhuang, G.; Deen, M.J.


Book ID
114554561
Publisher
IEEE
Year
1993
Tongue
English
Weight
511 KB
Volume
40
Category
Article
ISSN
0018-9499

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