𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A test structure for the electrical measurement of the misalignment between gate and diffusion regions in MOS/LSI circuits : Alicja Gluzinska, Andrzej A. Czerwinski and Maria Czerwinska. Electron Technol., Warsaw17 (1/2), 39 (1984)


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
132 KB
Volume
26
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.