✦ LIBER ✦

4956602 Wafer scale testing of redundant integrated circuit dies

✍ Scribed by WilliamJ Parrish

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electron beam testing of wafer-scale int

✍ Robert Heiland; Fred Fox; Siegfried Görlich 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 933 KB

4952272 Method of manufacturing probing

✍ Hironobu Okino; Akio Fujiwara; Yutaka Akiba; Susumu Kasukabe; Tsuyoshi Fujita; M 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 50 KB

Electron-beam customization, repair and

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 129 KB

4656592 Very large scale integrated circ

✍ Lambertus Spaanenburg; PeterB Duin; Roberto Woudsma; Poel Arie A van der 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 91 KB

Cumulative balance testing of logic circ

📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 111 KB