✦ LIBER ✦
Electron-beam customization, repair and testing of wafer-scale circuits : D. C. Shaver. Solid St. Technol. 135 (February 1984)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 129 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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