𝔖 Bobbio Scriptorium

✦ LIBER ✦

Cumulative balance testing of logic circuits : KRISHENDU CHAKRABARTY and JOHN P. HAYES. IEEE Transactions on Very Large Scale Integration (VLSI) System, 3(1), 72 (March 1995)

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 111 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)84401-5

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