4952272 Method of manufacturing probing head for testing equipment of semiconductor large scale integrated circuits

✍ Scribed by Hironobu Okino; Akio Fujiwara; Yutaka Akiba; Susumu Kasukabe; Tsuyoshi Fujita; Masao Mitani; Kazuo Hirota

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 50 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90287-h