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4549101 Circuit for generating test equalization pulse

✍ Scribed by LalC Sood

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 85 KB
Volume: 26
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(86)90704-3

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## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil