Characterization of Cr-doped TiO2 thin f
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Mu-Hsuan Chan; Wei-Yu Ho; Da-Yung Wang; Fu-Hsing Lu
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Article
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2007
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Elsevier Science
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English
β 621 KB
Cr-doped TiO 2 thin films were prepared by co-sputtering of titanium and chromium in a cathodic arc plasma evaporation system. X-ray diffraction (XRD), Auger electron spectroscopy (AES), field emission scanning electron microscopy (FE-SEM), and water contact angle measurement were used to characteri