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Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition

✍ Scribed by L. Borgese; M. Gelfi; E. Bontempi; P. Goudeau; G. Geandier; D. Thiaudière; L.E. Depero


Book ID
113919583
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
414 KB
Volume
206
Category
Article
ISSN
0257-8972

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