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XPS, LEED and AFM investigation of the Si(100) surface after the deposition and annealing of tellurium thin films

✍ Scribed by S. Santucci; S. Di Nardo; L. Lozzi; M. Passacantando; P. Picozzi

Book ID: 116067922
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 1001 KB
Volume: 352-354
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(95)01321-0

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