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AFM and XPS characterization of the Si(111) surface after thermal treatment

✍ Scribed by B. Lamontagne; D. Guay; D. Roy; R. Sporken; R. Caudano

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 645 KB
Volume: 90
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(95)00154-9

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