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XPS and AES investigations of silicon oxidation by ion-implanted oxygen

✍ Scribed by V.A. Labunov; P.V. Protasevich

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Oxidation behaviour of nickel silicides

✍ S. Valeri; U. Del Pennino; P. Sassaroli 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 274 KB

Oxidation behaviour of nickel silicides

✍ S. Valeri; U. Del Pennino; P. Sassaroli 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 370 KB

XPS studies of SiO2 surface layers forme

✍ Schulze, D. ;Finster, J. ;Hensel, E. ;Skorupa, W. ;Kreissig, U. 📂 Article 📅 1983 🏛 John Wiley and Sons 🌐 English ⚖ 203 KB

Surface characterization of Ti-implanted

✍ Masaya Iwaki; Katsumasa Yabe; Masaaki Suzuki; Okio Nishimura 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 288 KB

Combined SIMS, AES, and XPS investigatio

✍ H. Bispinck; O. Ganschow; L. Wiedmann; A. Benninghoven 📂 Article 📅 1979 🏛 Springer 🌐 English ⚖ 456 KB

Investigation of Ion Implanted Silicon b

✍ Gavrilenko, V. I. ;Klyui, N. I. ;Litovchenko, V. G. ;Romanyuk, B. N. 📂 Article 📅 1989 🏛 John Wiley and Sons 🌐 English ⚖ 401 KB