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X-ray Topography Used to Observe Dislocations in Epitaxially Grown Diamond Film

✍ Scribed by Kato, Yukako; Umezawa, Hitoshi; Yamaguchi, Hirotaka; Shikata, Shinichi

Book ID: 125900799
Publisher: Institute of Pure and Applied Physics
Year: 2012
Tongue: English
Weight: 678 KB
Volume: 51
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.51.090103

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