✦ LIBER ✦
Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography
✍ Scribed by D. Allen; J. Wittge; A. Zlotos; E. Gorostegui-Colinas; J. Garagorri; P.J. McNally; A.N. Danilewsky; M.R. Elizalde
- Book ID
- 108224679
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 824 KB
- Volume
- 268
- Category
- Article
- ISSN
- 0168-583X
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