X-ray topographic investigations of graphite interacalation compounds
β Scribed by Metz, W.; Josuks, P.; Kleimann, U.
- Book ID
- 122937190
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 230 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0379-6779
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π SIMILAR VOLUMES
Highly saturated lithium-graphite intercalation compounds (of a composition LiC,-LiC,) synthesized under high-pressure conditions were investigated using X-ray diffraction. It was shown that these compounds present the structure with hexagonal unit cell with a parameter 8.63 A, c = 31, = 3.3.7 = 11
and Alloys ## X-Ray Topographic Investigation of Dendritic Silicon Crystals Using Lang and double-crystal X-ray topographic methods the dislocation structure of dendritic silicon crystals have becn investigated. I t is shown that t,he surface layers of these crystals have a more perfect structure