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X-ray topographic investigations of deformed iron whiskers

✍ Scribed by Mende, H. H. ;Hagen, W.


Book ID
105372464
Publisher
John Wiley and Sons
Year
1977
Tongue
English
Weight
348 KB
Volume
42
Category
Article
ISSN
0031-8965

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X-Ray Topographic Investigation of Dendr
✍ Dr. M. Ya. Dashevsky; V. A. Isaakjan; M. A. Khatsernov πŸ“‚ Article πŸ“… 1972 πŸ› John Wiley and Sons 🌐 English βš– 379 KB πŸ‘ 1 views

and Alloys ## X-Ray Topographic Investigation of Dendritic Silicon Crystals Using Lang and double-crystal X-ray topographic methods the dislocation structure of dendritic silicon crystals have becn investigated. I t is shown that t,he surface layers of these crystals have a more perfect structure