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X-ray Topographic Assessment of Defects in Pure and Substituted Hexaferrite Crystals

✍ Scribed by Urvashi Raina; Sushma Bhat; Prof. P. N. Kotru; P. Franzosi; F. Licci

Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
746 KB
Volume
31
Category
Article
ISSN
0232-1300

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## Abstract Using the modified method of limited X‐ray topographs the distribution of defects along the silicon dendritic thickness was investigated. It is found that there are two dislocation sources in the given crystals, one of which acts near the surface and generates the loop‐shaped dislocatio