X-ray study of the component distribution in mould-grown Bi100-xSbx Crystals
β Scribed by Dr. H. Berger; Dr. G. Schneider
- Publisher
- John Wiley and Sons
- Year
- 1984
- Tongue
- English
- Weight
- 158 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0232-1300
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β¦ Synopsis
X-ray Study of the Component Distribution in Mould-grown Biloo4Sb, Crystals
Morild growing (a modified version of Bridgnian technique) is a suitable niethod for growing crystals with given shape and orientation (CHAIKIN et al.). Usually the inonld-grown crystals are plates with a thickness of 1 to 2 mm, or have the shape of a disc, or rod, or triangle etc. This technique was also applied to alloy crystals in the system Biloo-.Sh, (HERRMANN et al.; SCIINEIDER et al.). Difficulties occur due to segregation, because the complete concentration profile of normal freezing is arranged inside the sample. I t is essential that the distribution of components depends on sample geometry. This follows already from the simple niodel assuming steady coniplete mixing of the melt (PFANN). Figure 1 shows that in a triangular saniple the length of the homogeneous first grown region is larger than in samples having the shape of a disc or a rod.
π SIMILAR VOLUMES
## Abstract Using the modified method of limited Xβray topographs the distribution of defects along the silicon dendritic thickness was investigated. It is found that there are two dislocation sources in the given crystals, one of which acts near the surface and generates the loopβshaped dislocatio